Showing 1–20 of 20 results
/ Date/ Name
Oct 29, 2025Generative Image Restoration and Super-Resolution using Physics-Informed Synthetic Data for Scanning Tunneling MicroscopyAug 4, 2025Strong electron-electron interactions in a dilute weakly-localized metal near a metal-to-insulator transitionJun 2, 2025Overcoming Data Scarcity in Scanning Tunnelling Microscopy Image SegmentationMay 29, 2025Hydrogen Passivation Effects on Spatially Resolved Charge Trap Densities in Si(100)-SiO$_2$May 19, 2025Imaging the Acceptor Wave Function Anisotropy in SiliconSep 30, 2024Element-specific, non-destructive profiling of layered heterostructuresMar 12, 2024Spatially resolved random telegraph fluctuations of a single trap at the Si/SiO2 interfaceNov 9, 2023Single-Atom Control of Arsenic Incorporation in Silicon for High-Yield Artificial Lattice FabricationOct 2, 2023Resistless EUV lithography: photon-induced oxide patterning on siliconSep 29, 2023Momentum-space imaging of ultra-thin electron liquids in delta-doped siliconAug 19, 2022Non-destructive X-ray imaging of patterned delta-layer devices in siliconMar 16, 2022Room temperature donor incorporation for quantum devices: arsine on germaniumOct 19, 2021Substitutional tin acceptor states in black phosphorusOct 15, 2019Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling MicroscopyJun 2, 2019Topological phases of a dimerized Fermi-Hubbard model for semiconductor nano-latticesFeb 14, 20182D-3D crossover in a dense electron liquid in siliconMar 14, 2016Channels of oxygen diffusion in single crystal rubrene revealedDec 14, 2015Exact location of dopants below the Si(001):H surface from scanning tunnelling microscopy and density functional theoryJul 25, 2013Investigating individual arsenic dopant atoms in silicon using low-temperature scanning tunnelling microscopyJul 21, 2003Measurement of phosphorus segregation in silicon at the atomic-scale using STM