Showing 1–20 of 20 results
/ Date/ Name
Jun 24, 2019Morphology modifcation of Si nanopillars under ion irradiation at elevated temperatures: plastic deformation and controlled thinning to 10 nmJan 18, 2013Nucleation and growth of thin films of rod--like conjugated moleculesMay 6, 2025Defect analysis of the $β$- to $γ$-Ga$_{2}$O$_{3}$ phase transitionApr 1, 2020An atomic force microscope integrated with a helium ion microscope for correlative nanocharacterizationNov 7, 2013Helium Ion MicroscopyOct 15, 2015Nanometer scale elemental analysis in the helium ion microscope using time of flight spectrometryOct 10, 2019Site-controlled formation of single Si nanocrystals in a buried SiO2 matrix using ion beam mixingApr 26, 2013To see or not to see: Imaging surfactant coated nano--particles using HIM and SEMJan 9, 2025Control of magnon frequency combs in magnetic ringsJan 4, 2023Deterministic multi-level spin orbit torque switching using He+ microscopy patterningMay 31, 2023Roadmap for focused ion beam technologiesJul 2, 2011The influence of substrate temperature on growth of para-sexiphenyl thin films on Ir{111} supported graphene studied by LEEMApr 30, 2015Visualization of steps and surface reconstructions in Helium Ion Microscopy with atomic precisionMar 23, 2023Universal radiation tolerant semiconductorMay 15, 2020Helium Ion Microscopy for Reduced Spin Orbit Torque Switching CurrentsSep 27, 2022Tailoring crosstalk between localized 1D spin-wave nanochannels using focused ion beamsOct 28, 2023Ultralong-term high-density data storage with atomic defects in SiCOct 15, 2008Hierarchy of adhesion forces in patterns of photoreactive surface layersApr 27, 2022Wafer-scale nanofabrication of telecom single-photon emitters in siliconApr 30, 2024Programmable activation of quantum emitters in high-purity silicon with focused carbon ion beams