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"au:"C. Bongiorno"" — arXiv2 Search
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May 4, 2020
On the origin of the premature breakdown of thermal oxide on 3C-SiC probed by electrical scanning probe microscopy
Jan 22, 2020
Simulation of the growth kinetics in group IV compound semiconductors
Dec 27, 2019
Impact of stacking faults and domain boundaries on the electronic transport in cubic silicon carbide probed by conductive atomic force microscopy