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"au:"A. Dejneka"" — arXiv2 Search
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Aug 14, 2025
Electronic localization on the structural inhomogeneities formed due to Bi and Te deficiency in the MBE grown films of AFM topological insulator MnBi2Te4: Evidence from spectroscopic ellipsometry and infrared studies
Jan 12, 2023
Bismuth layer properties in the ultrathin Bi-FeNi multilayer films probed by spectroscopic ellipsometry