Errors in trapped-ion quantum gates due to spontaneous photon scattering
/ Authors
R. Ozeri, W. Itano, R. B. Blakestad, J. Britton, J. Chiaverini, J. Jost, C. Langer, D. Leibfried, R. Reichle, S. Seidelin
and 2 more authors
/ Abstract
We analyze the error in trapped-ion, hyperfine qubit, quantum gates due to spontaneous scattering of photons from the gate laser beams. We investigate single-qubit rotations that are based on stimulated Raman transitions and two-qubit entangling phase gates that are based on spin-dependent optical dipole forces. This error is compared between different ion species currently being investigated as possible quantum-information carriers. For both gate types we show that with attainable laser powers the scattering error can be reduced to below current estimates of the fault-tolerance error threshold.
Journal: Physical Review A