Coherent X-ray diffractive imaging: applications and limitations.
/ Authors
S. Marchesini, H. N. Chapman, S. Hau-Riege, R. A. London, Abraham Szöke, H. He, M. Howells, H. Padmore, R. Rosen, J. C. Spence
and 1 more author
/ Abstract
The inversion of a diffraction pattern offers aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems, the only limitation being radiation damage. We review our experimental results, discuss the fundamental limits of this technique and future plans.
Journal: Optics express
DOI: 10.1364/OE.11.002344