A Method for Ultrashort Electron Pulse Shape-Measurement Using Coherent Synchrotron Radiation

In this paper we discuss a method for nondestructive measurements of the longitudinal profile of sub-picosecond electron bunches for X-Ray Free Electron Lasers (XFELs). The method is based on the detection of the Coherent Synchrotron Radiation (CSR) spectrum produced by a bunch passing a dipole magnet system. This work also contains a systematic treatment of synchrotron radiation theory which lies at the basis of CSR. Standard theory of synchrotron radiation uses several approximations whose applicability limits are often forgotten: here we present a systematic discussion about these assumptions. Properties of coherent synchrotron radiation from an electron moving along an arc of a circle are then derived and discussed. We describe also an effective and practical diagnostic technique based on the utilization of an electromagnetic undulator to record the energy of the coherent radiation pulse into the central cone. This measurement must be repeated many times with different undulator resonant frequencies in order to reconstruct the modulus of the bunch form-factor. The retrieval of the bunch profile function from these data is performed by means of deconvolution techniques: for the present work we take advantage of a constrained deconvolution method. We illustrate with numerical examples the potential of the proposed method for electron beam diagnostics at the TESLA Test Facility (TTF) accelerator. Here we choose, for emphasis, experiments aimed at the measure of the strongly non-Gaussian electron bunch profile in the TTF femtosecond-mode operation. We demonstrate that a tandem combination of a picosecond streak camera and a CSR spectrometer can be used to extract shape information from electron bunches with a narrow leading peak and a long tail.