LATTICE MISFIT MEASUREMENT IN INCONEL 625 BY X-RAY DIFFRACTION TECHNIQUE

Determination of lattice misfit and microstructural parameters of the coherent precipitates in Ni based alloy Inconel-625 is a challenging problem as the diffraction peaks of the precipitate and the matrix are completely overlapping. X-ray Diffraction Line Profile Analysis (XRDLPA) has been used to characterize the bulk samples of Inconel 625 at different heat-treated conditions to determine the lattice parameters of the parent phase and also the coherent precipitates by the separation of the overlapping peaks. The lattice misfits of the coherent precipitates with the matrix and their microstructural parameters like size and strain have also been determined.