Angular dependence of direct rf power absorption studies in $Bi_{2}Sr_{2}CaCu_{2}O_{8}$ single crystals

We have studied rf power dissipation in $Bi_{2}Sr_{2}CaCu_{2}O_{8}$ single crystals as a function of angle \Theta between the applied field and c-axis of the crystal by using a novel technique of measuring direct rf power absorption. We observed two peaks in power absorption as a function of temperature. The amplitude and position of the first peak (peak A) change with orientation and attributed to Josephson junctions decoupling. The second peak (peak B) appears just below $T_{c}$ has been attributed to the vortex motion and its amplitude depends on the angle of orientation.