The XMM-Newton Hard Band Wide Angle Survey

We would like to stress that our XMM-Survey performed in the hard [7–11] keV band allows us to perform an accurate spectral analysis and characterization for the first time of a local reference sample, the least affected than any other by NH bias in order to derive a NH distribution and constrain the XRLF of absorbed objects. Considering the knowledge and scientific equipment available today, this is the best result we could achieve. Future study will cover the optical follow up and we plan to extend our survey to about 40 square degrees before October 1st 2003.