SENSEI at SNOLAB: Single-Electron Event Rate and Implications for Dark Matter
astro-ph.CO
/ Authors
Itay M. Bloch, Ana M. Botti, Mariano Cababie, Gustavo Cancelo, Brenda A. Cervantes-Vergara, Miguel Daal, Ansh Desai, Alex Drlica-Wagner, Rouven Essig, Juan Estrada
and 20 more authors
Erez Etzion, Guillermo Fernandez Moroni, Stephen E. Holland, Jonathan Kehat, Ian Lawson, Steffon Luoma, Aviv Orly, Santiago E. Perez, Dario Rodrigues, Nathan A. Saffold, Silvia Scorza, Miguel Sofo-Haro, Kelly Stifter, Javier Tiffenberg, Sho Uemura, Edgar Marrufo Villalpando, Tomer Volansky, Federico Winkel, Yikai Wu, Tien-Tien Yu
/ Abstract
We present results from data acquired by the SENSEI experiment at SNOLAB after a major upgrade in May 2023, which includes deploying 16 new sensors and replacing the copper trays that house the CCDs with a new light-tight design. We observe a single-electron event rate of $(1.39 \pm 0.11) \times 10^{-5}$ e$^-$/pix/day, corresponding to $(39.8 \pm 3.1)$ e$^-$/gram/day. This is an order-of-magnitude improvement compared to the previous lowest single-electron rate in a silicon detector and the lowest for any photon detector in the near-infrared-ultraviolet range. We use these data to obtain a 90% confidence level upper bound of $1.53 \times 10^{-5}$ e$^-$/pix/day and to set constraints on sub-GeV dark matter candidates that produce single-electron events. We hypothesize that the data taken at SNOLAB in the previous run, with an older tray design for the sensors, contained a larger rate of single-electron events due to light leaks. We test this hypothesis using data from the SENSEI detector located in the MINOS cavern at Fermilab.