Performance Evaluation of CMOS Annealing with Support Vector Machine
Ryoga Fukuhara, Makoto Morishita, Takahiro Katagiri, Masatoshi Kawai, Toru Nagai, Tetsuya Hoshino
Abstract
In this paper, support vector machine (SVM) performance was assessed utilizing a quantum-inspired complementary metal-oxide semiconductor (CMOS) annealer. The primary focus during performance evaluation was the accuracy rate in binary classification problems. A comparative analysis was conducted between SVM running on a CPU (classical computation) and executed on a quantum-inspired annealer. The performance outcome was evaluated using a CMOS annealing machine, thereby obtaining an accuracy rate of 93.7% for linearly separable problems, 92.7% for non-linearly separable problem 1, and 97.6% for non-linearly separable problem 2. These results reveal that a CMOS annealing machine can achieve an accuracy rate that closely rivals that of classical computation.