GHz sample excitation at the ALBA-PEEM.
/ Authors
M. Khaliq, J. M. Álvarez, Antonio Camps, N. Gonzalez, J. Ferrer, Ana Martinez-Carboneres, J. Prat, S. Ruiz-Gómez, M. Niño, F. Macià
and 2 more authors
/ Abstract
We describe a setup that is used for high-frequency electrical sample excitation in a cathode lens electron microscope with the sample stage at high voltage as used in many synchrotron light sources. Electrical signals are transmitted by dedicated high-frequency components to the printed circuit board supporting the sample. Sub-miniature push-on connectors (SMP) are used to realize the connection in the ultra-high vacuum chamber, bypassing the standard feedthrough. A bandwidth up to 4 GHz with -6 dB attenuation was measured at the sample position, which allows to apply sub-nanosecond pulses. We describe different electronic sample excitation schemes and demonstrate a spatial resolution of 56 nm employing the new setup.
Journal: Ultramicroscopy