Development of a High-Rate Front-End ASIC for X-Ray Spectroscopy and Diffraction Applications
/ Authors
E. Vernon, G. de Geronimo, J. Baldwin, Wei Chen, J. Fried, G. Giacomini, A. Kuczewski, J. Kuczewski, J. Mead, A. Miceli
and 8 more authors
J. Okasinski, D. Pinelli, O. Quaranta, A. Rumaiz, P. Siddons, Graham C. Smith, M. Stanaćević, R. Woods
/ Abstract
We developed a new front-end application-specific integrated circuit (ASIC) to upgrade the Maia X-ray microprobe. The ASIC instruments 32 configurable channels that perform either positive or negative charge amplification, pulse shaping, peak amplitude, and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1-<inline-formula> <tex-math notation="LaTeX">$\mu \text{s}$ </tex-math></inline-formula> peaking time, and a temperature of 248 K, an electronic resolution of 13 and 10 <inline-formula> <tex-math notation="LaTeX">$e^{-}$ </tex-math></inline-formula> rms was measured with and without a silicon drift detector (SDD) sensor, respectively. A spectral resolution of 170-eV full-width at half-maximum (FWHM) at 5.9 keV was obtained with an <sup>55</sup>Fe source. The channel linearity was better than ± 1 % with rate capabilities up to 40 kcps. The ASIC was fabricated in a commercial 250-nm process with a footprint of 6.3 mm <inline-formula> <tex-math notation="LaTeX">$\times $ </tex-math></inline-formula> 3.9 mm and dissipates 167 mW of static power.
Journal: IEEE Transactions on Nuclear Science