Measurement of quasiparticle transport in aluminum films using tungsten transition-edge sensors
/ Authors
J. Yen, B. Shank, Betty A. Young, B. Cabrera, P. Brink, M. Cherry, J. Kreikebaum, R. Moffatt, P. Redl, A. Tomada
and 1 more author
/ Abstract
We report on experimental studies of phonon sensors which utilize quasiparticle diffusion in thin aluminum films connected to tungsten transition-edge-sensors (TESs) operated at 35 mK. We show that basic TES physics and a simple physical model of the overlap region between the W and Al films in our devices enables us to accurately reproduce the experimentally observed pulse shapes from x-rays absorbed in the Al films. We further estimate quasiparticle loss in Al films using a simple diffusion equation approach. These studies allow the design of phonon sensors with improved performance.
Journal: Applied Physics Letters
DOI: 10.1063/1.4899130