Trapping-detrapping fluctuations in organic space-charge layers
/ Authors
/ Abstract
A trapping-detrapping model is proposed for explaining the current fluctuation behavior in organic semiconductors (polyacenes) operating under current-injection conditions. The fraction of ionized traps obtained from the current-voltage characteristics, is related to the relative current noise spectral density at the trap-filling transition. The agreement between theory and experiments validates the model and provides an estimate of the concentration and energy level of deep traps.
Journal: Applied Physics Letters
DOI: 10.1063/1.3271769