Broadband soft x-ray polarimetry

We developed an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics, using a method previously described by Marshall (2008) involving laterally graded, multilayer-coated flat mirrors. We present possible science investigations with such an instrument and two possible configurations. This instrument could be used in a small orbiting mission or scaled up for the International X-ray Observatory. Laboratory work has begun that would demonstrate the capabilities of key components.